NEOSEM has a Broad Product Portfolio across diverse Memory BI testing applications.
Our complete product portfolio gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market.
Our Memory BI Test Systems Product portfolio is highly configurable with Test Electronics and thermal chambers to address our customers' concerns about the quality of their devices as well as Time to Yield.
Our customers have choice of tester speed from 20MHz to 400Mbps and chamber temperature from -60℃ to +150℃ depend on the device application. Customers can configure chambers as required – from one to 32 BIBs in each chamber. Our Automated Burn In Test Systems can be configured with a myriad of thermal control options and are highly flexible to address our customers' concerns about cost of manufacturing and operational efficiency.